| ex1 | The
thickness of the liquid-vapour interface of liquid argon near its triple point
(84K) |
 |
| ex2 | The
thickness of the liquid-vapour interface of carbon tetrachloride near the critical
temperature |
|
| ex3 | Ordering
at the surface of an isotropic liquid crystal |
|
| ex4 | Adsorption
of water on various clean smooth solid surfaces as a function of humidity |
|
| ex5 | Adsorption
of pentane onto various solid surfaces |
|
| ex6 | Premelting
of the single crystal ice surface |
|
| ex7 | Very
thin layers of DLC (Diamond Like Carbon) on silicon |
|
| ex8 | Surface
uniformity |
|
| ex9 | Real
time study of thinning of photoresist layer on silicon |
|
| ex10 | Analysis
of photoresist sample using single layer curve-fitting |
|
| ex11 | Etching
of 50nm photoresist sample, 100pts per second |
|
| ex12 | Imaging
Ellipsometer Image Examples |
|
Examples
of Ellipsometry in Application
