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Imaging Ellipsometer: Applications

Surface plot of ellipsometry signal

An ellipsometric image of the sample surface allows to measure layer thicknesses smaller than the wavelength of the illuminating light. This effectively adds a third dimension to the data.

By imaging the entire surface area at once, the Imaging Ellipsometer is much faster than a point-by-point scan of the sample with a conventional ellipsometer. It can follow dynamic phenomena in real time, such as the spreading of drops on liquid and solid surfaces, and surface chemical reactions. The system can also be used as a Brewster Angle Microscope for video intensity measurements at up to 100 frames per second.

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All material on this page is copyright. Last updated: Thursday, 18 January 2001