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By
imaging the entire surface area at once, the Imaging
Ellipsometer is much faster than a point-by-point
scan of the sample with a conventional ellipsometer.
It can follow dynamic phenomena in real time,
such as the spreading of drops on liquid and solid
surfaces, and surface chemical reactions.
The
system can also be used as a Brewster Angle
Microscope for video intensity measurements
at up to 100 frames per
second.
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An
ellipsometric image of the sample surface allows
to measure layer thicknesses smaller than the
wavelength of the illuminating light. This effectively adds
a third dimension to the data.
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