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Imaging Ellipsometer - Advantages
 Light Picometer
 Modular System
 Custom Design
 & Data Analysis

By imaging the entire surface area at once, the Imaging Ellipsometer is much faster than a point-by-point scan of the sample with a conventional ellipsometer. It can follow dynamic phenomena in real time, such as the spreading of drops on liquid and solid surfaces, and surface chemical reactions.

The system can also be used as a Brewster Angle Microscope for video intensity measurements at up to 100 frames per second.


An ellipsometric image of the sample surface allows to measure layer thicknesses smaller than the wavelength of the illuminating light. This effectively adds a third dimension to the data.


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