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 | Picometer
Ellipsometer | |
A
high speed (2ms response), high sensitivity (1/100 monolayer of oxide on silicon)
single wavelength, single beam ellipsometer based on the Birefringence Modulation
design, for measurements of ultra-thin surface layers. Sensitivity limited by
Photon Shot noise. Illumination areas to as small as 15 microns. |
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 | Imaging
Ellipsometer | |
Uses
a CCD detector and microscope zoom lens to produce ellipticity images of a surface
in typically 20s. Ideal for inhomogenous or patterned surfaces - sample scanning
is not required. |
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| | The
spectroscopic version of the high speed, high sensitivity Standard Picometer,
covering the wavelength range 250nm to 1700nm (extensions to 200nm are also available). |
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 | Light
Picometer | |
A
low cost version of the Picometer mounted on the lower precision Light Optical
Table. |
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 | Imaging
Reflectometer | |
Produces
Reflectivity images of the imaged area, useful, for instance, for studying fibre
optic anti-reflection coatings on small fibre-optic surfaces. |
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 | Modular
System | |
Our
components can be mounted in many configurations to suit the customer. The instruments
can be used to study polarised and unpolarised light. Examples: studies of Circular
Dichroism, the distribution of scattered light from rough surfaces, reflection
and transmission by anisotropic crystal, etc. |
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 | Consultancy,
Custom Design
& Data Analysis | |
The
experience and skills of our staff are available to help with your metrology problems
and assist with data analysis. We can also design a system to suit your requirements. |
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