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Picometer
Ellipsometer |
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A
high speed (2ms response), high sensitivity (1/100 monolayer
of oxide on silicon) single wavelength, single beam ellipsometer
based on the Birefringence Modulation design, for measurements
of ultra-thin surface layers. Sensitivity limited by Photon
Shot noise. Illumination areas to as small as 15 microns |
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Imaging
Ellipsometer |
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Uses
a CCD detector and microscope zoom lens to produce ellipticity
images of a surface in typically 1s. Ideal for inhomogenous
or patterned surfaces - sample scanning is not required |
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Combines
the Standard Picometer with the Imaging Ellipsometer.
Use the Imaging system to survey a larger area, and the
Picometer to provide high speed analysis of a spot within
the imaged area |
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The
spectroscopic version of the high speed, high sensitivity
Standard Picometer, covering the wavelength range 230nm
to 1700nm (extension to 190nm will soon be available) |
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Light
Picometer |
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A
low cost version of the Picometer mounted on the lower
precision Light Optical Table |
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Imaging
Reflectometer |
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Produces
Reflectivity images of the imaged area, useful, for instance,
for studying fibre optic anti-reflection coatings on small
fibre-optic surfaces |
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Modular
System |
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Our
components can be mounted in many configurations to suit
the customer. The instruments can be used to study polarised
and unpolarised light. Examples: studies of Circular Dichroism,
the distribution of scattered light from rough surfaces,
reflection and transmission by anisotropic crystal, etc |
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Consultancy,
Custom Design
& Data Analysis |
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The
experience and skills of our staff are available to help
with your metrology problems and assist with data analysis.
We can also design a system to suit your requirements |
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