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The modular system allows a single-wavelength
Picometer Ellipsometer to be modified for spectral
measurements, or turned into an Imaging Ellipsometer
for mapping an area on a sample instantaneously.
The
components of the Picometer and Imaging Ellipsometer
can be combined into the Image-Enhanced Ellipsometer.
These modifications can be made at any time, and
require only the purchase of the additional components,
while others such as light sources and polarisers
are kept. Light sources and filters can be changed
to adjust the spectral range, and components can
be shared between different instruments.
Blank
mounts are available, allowing users to add components
of their own design. In this way, the standard
configuration of any ellipsometer can quickly
be adapted to a wide range of measurements, protecting
your investment.
In
addition, the Modular System is the ideal solution
for researchers who need to set up a customized
system cost efficiently and fast. In both standard
and non-standard applications, the Modular System
makes our instruments easy to use, affordable,
and
flexible.
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