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The following technical notes and applications papers are in Acrobat PDF format. If your computer does not display the files correctly you can download the free viewer from Adobe. Use the browser "back" button to return to this page.

Software Updates

We are continually working to improve the performance of our products and respond to feedback. Software updates are now available here for existing customers.

Technical Notes

TN1A	Operating Theory of the Picometer
TN1	Outline of the Ellipsometry of Thin Layers Using the Picometer Ellipsometer
TN2	Beaglehole Ellipsometry Parameters
TN3	The Precision Optical Table - Specifications & Dimensions

Application Notes

AP1	Selected References and Research Papers
AP2	Reflection of Light and Ellipsometry Theory
AP3	Ellipsometer Sensitivity - Comments on Error Analysis
AP4	Study of Blue OLED Layer on 0.7mm Glass Substrate
AP5	Study of Patterned Wafer Using Spectroscopic Picometer and Imaging Ellipsometer
AP6	Real-time Study of Etching of Photoresist on Silicon Samples
AP7	Very Thin Gate Oxide/Nitride Layers on Silicon
AP8	Optical spectroscopy of chiral liquids
AP9	Report on spectroscopic study of thin oxide-nitride samples
AP10	Reflectivity and Ellipsometry Scatterometry Studies of Diffraction Gratings
AP11	Imaging Study of STI patterned wafer

This page is a work in progress (and perhaps it should always be that way as part of a process of continuous improvement).

In due course we intend to provide answers to Frequently Asked Questions (FAQ's), technical notes describing the technology we use and applications notes intended to provide more details than will be found in the examples on the Examples pages.

Remember that we can provide advice and consultancy skills to assist in finding solutions to your metrology problems and analysing the data collected using Beaglehole Instruments equipment. For contact details, see the Contacts page.